VLSI Test Technology and Reliability

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Author:

S. Hamdioui

Subject:

Science and Technology

Institution Name:

Delft University of Technology

Collection:

Delft University OpenCourseWare

Grade Level:

Post-secondary

Abstract:

With the continue scaling of transistor feature sizes, VLSI chip density continue increases. This results in a continue increase in the complexity VLSI technology where it has reached the point where billions of transistors are integrated on a single chip (like it is the case for System on Chip). To guarantee the satisfaction of the customers, the produced VLSI chips have to be reliable and fully tested. Verification testing and production testing represents 50 t0 60% of the cost of making VLSI chips, and are now the biggest cost of the technology. It has been known for a while that tackling the problems associated with testing VLSI chips at earlier design stage levels significantly reduces testing cost. Thus it is important for hardware designers to be exposed to concepts of VLSI testing which can help them design better product at lower cost.

Languages:

English

Material Type:

Assessments, Lecture Notes, Readings

Media Format:

Downloadable docs

Conditions of Use:

Creative Commons Attribution-Noncommercial-Share Alike 3.0

Copyright Holder:

TU Delft OpenCourseWare