Crystal Structure Analysis, Spring 2010
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- Author:
- Mueller, Peter
- Subject:
- Science and Technology
- Institution:
- M.I.T.
- Collection:
- MIT OpenCourseWare
- Level:
- Graduate / Professional
- Abstract:
" This course covers the following topics: X-ray diffraction: symmetry, space groups, geometry of diffraction, structure factors, phase problem, direct methods, Patterson methods, electron density maps, structure refinement, how to grow good crystals, powder methods, limits of X-ray diffraction methods, and structure data bases."
- Language:
- English
- Material Type:
- Full Course, Lecture Notes, Other
- Media Format:
- Downloadable docs, Text/HTML
- Conditions of Use:
-
Creative Commons Attribution-Noncommercial-Share Alike 3.0
Creative Commons Attribution-NonCommercial-ShareAlike 3.0
