Students learn about current electricity and necessary conditions for the existence of an electric current. Students construct a simple electric circuit and a galvanic cell to help them understand voltage, current and resistance.
Subject:
Mathematics and Statistics, Science and Technology
Students gain an understanding of the difference between electrical conductors and insulators, and experience recognizing a conductor by its material properties. In a hands-on activity, students build a conductivity tester to determine whether different objects are conductors or insulators. In another activity, students use their understanding of electrical properties to choose appropriate materials to design and build their own basic circuit switch.
Subject:
Mathematics and Statistics, Science and Technology
This homework assignment is part of ECE 606 "Solid State Devices" (Purdue University). It contains 5 problems which lead students through a comparison of the depletion approximation and an exact solution of PN junction diodes. Students compute the exact solution by using the PN Junction Lab available on nanoHUB.org.
The physics of microelectronic semiconductor devices for silicon integrated circuit applications. Topics: semiconductor fundamentals, p-n junction, metal-oxide semiconductor structure, metal-semiconductor junction, MOS field-effect transistor, and bipolar junction transistor. Emphasis on physical understanding of device operation through energy band diagrams and short-channel MOSFET device design. Issues in modern device scaling outlined. Includes device characterization projects and device design project.
Introduction to Solid State Chemistry is a first-year single-semester college course on the principles of chemistry. This unique and popular course satisfies MIT's general chemistry degree requirement, with an emphasis on solid-state materials and their application to engineering systems.
6.780 covers statistical modeling and the control of semiconductor fabrication processes and plants. Topics include design of experiments, response surface modeling, and process optimization; defect and parametric yield modeling; process/device/circuit yield optimization; monitoring, diagnosis, and feedback control of equipment and processes; analysis and scheduling of semiconductor manufacturing operations.
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